Wafer Level Test

Wafer Level Test

AC and DC Electronic load Model 63800 series

  • Simultaneous double side color inspection
  • 6" wafer / 8" inspection area
  • Automatic wafer alignment
  • Wafer shape / edge identification

Photonics Wafer Probing Test System Model 58635 Series

  • Up to 6" wafer
  • Wide range and precise temperature control
  • Support both pulse and CW operation
  • LIV test, Near Field test, Far Field test